Study of the leakage field of magnetic force microscopy thin-film tips using electron holography

نویسندگان

  • B. G. Frost
  • N. F. van Hulst
  • G. Matteucci
  • E. Rikkers
چکیده

Electron holography is applied for the study of the leakage field of thin-film ferromagnetic tips used as probes in magnetic force microscopy. We used commercially available pyramidal tips covered on one face with a thin NiCo film, which were then placed in a high external magnetic field directed along the pyramid axis. Good agreement between simulated and experimental electron phase difference maps allows to measure the local flux from the ferromagnetic tips and therefore to evaluate the perturbation induced by the microprobe stray field on the sample area. © 1996 American Institute of Physics. @S0003-6951~96!03813-5#

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Dry and Wet Wear Characteristic of TiO2 Thin Film Prepared by Magnetic Sputtering in Ringer Solution

In this research, a thin film of TiO2 was applied on AZ91D using the method of magnetic sputtering. Microstructure investigations were done using field emission scanning electron microscope (FESEM) and X-ray diffraction (XRD). Wear resistance for the coating was investigated using the pin on the disk in the form of dry and in the Ringer's solution. After this test, the worn surface of the sampl...

متن کامل

Imaging Perpendicular Magnetic Domains in Plan-view Using Lorentz Transmission Electron Microscopy

The study of magnetic materials requires an understanding of not only their magnetic properties, but also their microstructure. Transmission electron microscopy (TEM) is a powerful characterization instrument because of its ability to provide both microstructural and magnetic information. In TEM, electrons can be deflected by a Lorentz force created by a magnetic field from a magnetic material....

متن کامل

Investigation of Physical Properties of e-Beam Evaporated CdTe Thin Films for Photovoltaic Application

CdTe thin films with 2.8 µm thickness were deposited by electron beam evaporation method. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and atomic force microscopy (AFM) were used to characterize the films. The results of AFM analysis revealed that the CdTe films have uniform surface. CdTe thin films were heat-treated by SnCl2 solution. Structural analysis using XRD s...

متن کامل

Band-Gap Tuning Of Electron Beam Evaporated Cds Thin Films

The effect of evaporation rate on structural, morphological and optical properties of electron beam evaporated CdS thin films have been investigated. CdS thin film deposited by electron beam evaporation method in 12nm/min and 60nm/min evaporation rates on glass substrates. X-ray diffraction, scanning electron microscopy, UV-Vis-NIR spectroscopy and Atomic Force Microscopy were used to character...

متن کامل

The effect of saccharin on microstructure and corrosion behavior of nanocrystalline nickel thin films in alkaline solution

In this study the effect of crystallite size reduction and microstructure on the electrochemical corrosion behavior of nanocrystalline nickel (NC Ni) were investigated using Tafel polarization and electrochemical impedance spectroscopy (EIS) measurements in 10 wt.% NaOH. NC Ni coatings were produced by direct current electrodeposition using chloride baths in presence and absence of saccharin as...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1996